Atomic-resolution imaging of the polar (0001) surface of LiNbO3 in aqueous solution by frequency modulation atomic force microscopy
Rode, Sebastian ; Hölscher, Rebecca ; Sanna, Simone ; Klassen, Stefanie ; Kobayashi, Kei ; Yamada, Hirofumi ; Schmidt, Wolf Gero ; Kühnle, AngelikaIn: Physical Review B, Vol. 86 Issue 7Charge compensation by long-period reconstruction in strongly polar lithium niobate surfaces
Sanna, Simone ; Rode, Sebastian ; Hölscher, Rebecca ; Klassen, Stefanie ; Marutschke, Christoph ; Kobayashi, Kei ; Yamada, Hirofumi ; Schmidt, Wolf Gero ; Kühnle, AngelikaIn: Physical Review B, Vol. 88 Issue 11Clear Signature of the (2 x 1) Reconstruction of Calcite (1014)
Schütte, Jens ; Rahe, Philipp ; Tröger, Lutz ; Rode, Sebastian ; Bechstein, Ralf ; Reichling, Michael ; Kühnle, AngelikaIn: Langmuir, Vol. 26 Issue 11, page 8295-8300Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode
Rode, Sebastian ; Schreiber, Martin ; Kühnle, Angelika ; Rahe, PhilippIn: Review of Scientific Instruments, Vol. 85 Issue 4, page 43707 et seq.Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment
Rode, Sebastian ; Stark, R. ; Lübbe, Jannis ; Tröger, Lutz ; Schütte, Jens ; Umeda, K. ; Kobayashi, Kei ; Yamada, Hirofumi ; Kühnle, AngelikaIn: Review of Scientific Instruments, Vol. 82 Issue 7Monolayer Structure of Arachidic Acid on Graphite
Thomas, Loji K. ; Kühnle, Angelika ; Rode, Sebastian ; Beginn, Uwe ; Reichling, MichaelIn: Journal of Physical Chemistry C, Vol. 114 Issue 44, page 18919-18924Photothermal excitation setup for a modified commercial atomic force microscope
Adam, Holger ; Rode, Sebastian ; Schreiber, Martin ; Kobayashi, Kei ; Yamada, Hirofumi ; Kühnle, AngelikaIn: Review of Scientific Instruments, Vol. 85 Issue 2, page 23703 et seq.Surface Modification of Luminescent Lanthanide Phosphate Nanorods with Cationic "Quat-primer" Polymers
Komban, Rajesh ; Beckmann, Ralph ; Rode, Sebastian ; Ichilmann, Sachar ; Kühnle, Angelika ; Beginn, Uwe ; Haase, MarkusIn: Langmuir, Vol. 27 Issue 16, page 10174-10183Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy
Lübbe, Jannis ; Temmen, Matthias ; Rode, Sebastian ; Rahe, Philipp ; Kühnle, Angelika ; Reichling, MichaelIn: Beilstein Journal of Nanotechnology, Vol. 4, page 32-44True Atomic-Resolution Imaging of (1014) Calcite in Aqueous Solution by Frequency Modulation Atomic Force Microscopy
Rode, Sebastian ; Oyabu, Noriaki ; Kobayashi, Kei ; Yamada, Hirofumi ; Kühnle, AngelikaIn: Langmuir, Vol. 25 Issue 5, page 2850-2853Unraveling the LiNbO3 X-cut surface by atomic force microscopy and density functional theory
Sanna, Simone ; Schmidt, Wolf Gero ; Rode, Sebastian ; Klassen, Stefanie ; Kühnle, AngelikaIn: Physical Review B, Vol. 89 Issue 7, page 75403 et seq.